Language: English
ISBN/ISSN: 730203589X
Published on: 2001-01
Hardcover
【Introduction】
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of Tem applications. Volume 2 illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.
【Main Contents】
1.The Guidance Role of HRTEM in Developing Mesoporous Molecular Sieves
2.HREM Study of Carbon Nanoclusters Grown from Carbon Arc-Discharge
3.Determining the Helicity of Carbon Nanotubes by Electron Diffraction
4.Low Dimensional Materials and Their Microstructures Studied by High Resolution Electron Microscopy
5.Microstructures of High-Tc Superconducting Josephson Junctions
6.Swift Heavy Ion Irradiation Damage in YBa2Cu3O7-δ Superconductors
7.Transmission Electron Microscopy Investigations of Misfit Dislocations in Lattice-Mismatched Semiconductor Heterostructures
8.Dislocation Contrast Analysis: a Study of δ′Heterogeneous Nucleation on Dislocations
9.Transmission Electron Cryomicroscopy and Three-Dimensional Reconstruction of Macromolecular Complexes
